Page 08/11/2014 21:25:47

Good show in IEEE RSAMD 2014!

8/11/2014
Reliability has not been our forte – however, there is no harm in trying and nobody is ever late learning new stuff. Therefore, Ghoneim’s paper with Arwa on Reliability of Conformal Electronics in Curvilinear Environments: Device First vs. Device Last Approach being accepted in 2014 IEEE Conference on Reliability Science for Advanced Materials and Devices is definitely a good achievement. Congratulations!
 
We also have one invited lecture and one invited talk in RSAMD 2014 – good show indeed!