Reliability has not been our forte – however, there is no
harm in trying and nobody is ever late learning new stuff. Therefore, Ghoneim’s
paper with Arwa on Reliability of Conformal Electronics in Curvilinear
Environments: Device First vs. Device Last Approach being accepted in 2014 IEEE
Conference on Reliability Science for Advanced Materials and Devices is
definitely a good achievement. Congratulations!
We also have one invited lecture and one invited talk in RSAMD
2014 – good show indeed!